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Fast positioning for X-ray scanning microscopy by a combined motion of sample and beam-defining optics

Scanning X-ray microscopy such as X-ray ptychography requires accurate and fast positioning of samples in the X-ray beam. Sample stages often have a high mobile mass as they may carry additional mechanics or mirrors for position measurements. The high mobile mass of a piezo stage can introduce vibra...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Veröffentlicht in:J Synchrotron Radiat
Hauptverfasser: Odstrcil, Michal, Lebugle, Maxime, Lachat, Thierry, Raabe, Jörg, Holler, Mirko
Format: Artigo
Sprache:Inglês
Veröffentlicht: International Union of Crystallography 2019
Schlagworte:
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC6412177/
https://ncbi.nlm.nih.gov/pubmed/30855261
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S160057751801785X
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