Nicholls, J., Dimitrijev, S., Tanner, P., & Han, J. (2019). Description and Verification of the Fundamental Current Mechanisms in Silicon Carbide Schottky Barrier Diodes. Sci Rep.
Citação norma ChicagoNicholls, Jordan, Sima Dimitrijev, Philip Tanner, and Jisheng Han. "Description and Verification of the Fundamental Current Mechanisms in Silicon Carbide Schottky Barrier Diodes." Sci Rep 2019.
Citação norma MLANicholls, Jordan, Sima Dimitrijev, Philip Tanner, and Jisheng Han. "Description and Verification of the Fundamental Current Mechanisms in Silicon Carbide Schottky Barrier Diodes." Sci Rep 2019.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.