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Lift-off Effect for Capacitive Imaging Sensors
Capacitive Imaging (CI) sensors are capable of non-destructively detecting both surface and hidden defects in dielectric materials and characterizing conducting surfaces through a relatively thick insulation layer. However, the complex Measurement Sensitivity Distribution (MSD) of CI sensors render...
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| Опубликовано в: : | Sensors (Basel) |
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| Главные авторы: | , , , , |
| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
MDPI
2018
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| Предметы: | |
| Online-ссылка: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6308521/ https://ncbi.nlm.nih.gov/pubmed/30563150 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s18124286 |
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