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Dielectric Properties and Ion Transport in Layered MoS(2) Grown by Vapor-Phase Sulfurization for Potential Applications in Nanoelectronics
[Image: see text] Electronic and dielectric properties of vapor-phase grown MoS(2) have been investigated in metal/MoS(2)/silicon capacitor structures by capacitance–voltage and conductance-voltage techniques. Analytical methods confirm the MoS(2) layered structure, the presence of interfacial silic...
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| Gepubliceerd in: | ACS Appl Nano Mater |
|---|---|
| Hoofdauteurs: | , , , , , , , |
| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
American Chemical
Society
2018
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| Online toegang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6257629/ https://ncbi.nlm.nih.gov/pubmed/30506042 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acsanm.8b01412 |
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