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Potential of ITO thin film for electrical probe memory applications

Electrical probe memory has received considerable attention during the last decade due to its prospective potential for the future mass storage device. However, the electrical probe device with conventional diamond-like carbon capping and bottom layers encounters with large interfacial contact resis...

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Detalles Bibliográficos
Publicado en:Sci Technol Adv Mater
Main Authors: Wang, Lei, Wen, Jing, Yang, Cihui, Xiong, Bangshu
Formato: Artigo
Idioma:Inglês
Publicado: Taylor & Francis 2018
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Acceso en liña:https://ncbi.nlm.nih.gov/pmc/articles/PMC6211315/
https://ncbi.nlm.nih.gov/pubmed/30397417
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1080/14686996.2018.1534072
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