Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS(2), MoSe(2), WS(2) and WSe(2)

The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nano...

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發表在:Nanomaterials (Basel)
Main Authors: Niu, Yue, Gonzalez-Abad, Sergio, Frisenda, Riccardo, Marauhn, Philipp, Drüppel, Matthias, Gant, Patricia, Schmidt, Robert, Taghavi, Najme S., Barcons, David, Molina-Mendoza, Aday J., de Vasconcellos, Steffen Michaelis, Bratschitsch, Rudolf, Perez De Lara, David, Rohlfing, Michael, Castellanos-Gomez, Andres
格式: Artigo
語言:Inglês
出版: MDPI 2018
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Article
在線閱讀:https://ncbi.nlm.nih.gov/pmc/articles/PMC6163246/
https://ncbi.nlm.nih.gov/pubmed/30223445
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano8090725
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