Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS(2), MoSe(2), WS(2) and WSe(2)

The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nano...

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Bibliografski detalji
Izdano u:Nanomaterials (Basel)
Glavni autori: Niu, Yue, Gonzalez-Abad, Sergio, Frisenda, Riccardo, Marauhn, Philipp, Drüppel, Matthias, Gant, Patricia, Schmidt, Robert, Taghavi, Najme S., Barcons, David, Molina-Mendoza, Aday J., de Vasconcellos, Steffen Michaelis, Bratschitsch, Rudolf, Perez De Lara, David, Rohlfing, Michael, Castellanos-Gomez, Andres
Format: Artigo
Jezik:Inglês
Izdano: MDPI 2018
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Article
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC6163246/
https://ncbi.nlm.nih.gov/pubmed/30223445
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano8090725
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