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Serial electron crystallography for structure determination and phase analysis of nanocrystalline materials
Serial electron crystallography has been developed as a fully automated method to collect diffraction data on polycrystalline materials using a transmission electron microscope. This enables useful data to be collected on materials that are sensitive to the electron beam and thus difficult to measur...
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| Publicat a: | J Appl Crystallogr |
|---|---|
| Autors principals: | , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
International Union of Crystallography
2018
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6157704/ https://ncbi.nlm.nih.gov/pubmed/30279637 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576718009500 |
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