Caricamento...

The etiology of oxidative stress in insulin resistance

Insulin resistance is a prevalent syndrome in developed as well as developing countries. It is the predisposing factor for type 2 diabetes mellitus, the most common end stage development of metabolic syndrome in the United States. Previously, studies investigating type 2 diabetes have focused on bet...

Descrizione completa

Salvato in:
Dettagli Bibliografici
Pubblicato in:Biomed J
Autori principali: Hurrle, Samantha, Hsu, Walter H.
Natura: Artigo
Lingua:Inglês
Pubblicazione: Chang Gung University 2017
Soggetti:
Accesso online:https://ncbi.nlm.nih.gov/pmc/articles/PMC6138814/
https://ncbi.nlm.nih.gov/pubmed/29179880
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.bj.2017.06.007
Tags: Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne! !