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The etiology of oxidative stress in insulin resistance

Insulin resistance is a prevalent syndrome in developed as well as developing countries. It is the predisposing factor for type 2 diabetes mellitus, the most common end stage development of metabolic syndrome in the United States. Previously, studies investigating type 2 diabetes have focused on bet...

詳細記述

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書誌詳細
出版年:Biomed J
主要な著者: Hurrle, Samantha, Hsu, Walter H.
フォーマット: Artigo
言語:Inglês
出版事項: Chang Gung University 2017
主題:
オンライン・アクセス:https://ncbi.nlm.nih.gov/pmc/articles/PMC6138814/
https://ncbi.nlm.nih.gov/pubmed/29179880
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.bj.2017.06.007
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