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Markov random field segmentation for industrial computed tomography with metal artefacts

X-ray Computed Tomography (XCT) has become an important tool for industrial measurement and quality control through its ability to measure internal structures and volumetric defects. Segmentation of constituent materials in the volume acquired through XCT is one of the most critical factors that inf...

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Bibliografiske detaljer
Udgivet i:J Xray Sci Technol
Main Authors: Jaiswal, Avinash, Williams, Mark A., Bhalerao, Abhir, Tiwari, Manoj K., Warnett, Jason M.
Format: Artigo
Sprog:Inglês
Udgivet: IOS Press 2018
Fag:
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC6130414/
https://ncbi.nlm.nih.gov/pubmed/29562573
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3233/XST-17322
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