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Review for Retrospective Exposure Assessment Methods Used in Epidemiologic Cancer Risk Studies of Semiconductor Workers: Limitations and Recommendations

This article aims to provide a systematic review of the exposure assessment methods used to assign wafer fabrication (fab) workers in epidemiologic cohort studies of mortality from all causes and various cancers. Epidemiologic and exposure–assessment studies of silicon wafer fab operations in the se...

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Detalhes bibliográficos
Publicado no:Saf Health Work
Autor principal: Park, Donguk
Formato: Artigo
Idioma:Inglês
Publicado em: Occupational Safety and Health Research Institute 2018
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6129997/
https://ncbi.nlm.nih.gov/pubmed/30370156
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.shaw.2018.05.005
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