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Dealing with image shifting in 3D ToF-SIMS depth profiles
The high sputter efficiency and low damage of gas cluster ion beams have enabled depth profiling to greater depths within organic samples using time-of-flight secondary ion mass spectrometry (ToF-SIMS). Due to the typically fixed geometry of the ion sources used in ToF-SIMS, as one digs into a surfa...
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| I publikationen: | Biointerphases |
|---|---|
| Huvudupphovsmän: | , |
| Materialtyp: | Artigo |
| Språk: | Inglês |
| Publicerad: |
American Vacuum Society
2018
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| Ämnen: | |
| Länkar: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6125139/ https://ncbi.nlm.nih.gov/pubmed/30185054 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1116/1.5041740 |
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