Yüklüyor......

Dealing with image shifting in 3D ToF-SIMS depth profiles

The high sputter efficiency and low damage of gas cluster ion beams have enabled depth profiling to greater depths within organic samples using time-of-flight secondary ion mass spectrometry (ToF-SIMS). Due to the typically fixed geometry of the ion sources used in ToF-SIMS, as one digs into a surfa...

Ful tanımlama

Kaydedildi:
Detaylı Bibliyografya
Yayımlandı:Biointerphases
Asıl Yazarlar: Graham, Daniel J., Gamble, Lara J.
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: American Vacuum Society 2018
Konular:
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC6125139/
https://ncbi.nlm.nih.gov/pubmed/30185054
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1116/1.5041740
Etiketler: Etiketle
Etiket eklenmemiş, İlk siz ekleyin!