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Plane wave imaging improves single track location shear wave elasticity imaging

Single track location shear wave elasticity imaging (STL-SWEI) is immune to speckle bias, but the quality of the images is depth-dependent. We hypothesize that plane wave imaging can reduce the depth dependency of STL-SWEI. To test this hypothesis, we developed a novel technique known as plane-wave...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:IEEE Trans Ultrason Ferroelectr Freq Control
Egile Nagusiak: Ahmed, Rifat, Gerber, Scott A., McAleavey, Stephen A., Schifitto, Giovanni, Doyley, Marvin M.
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: 2018
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC6117195/
https://ncbi.nlm.nih.gov/pubmed/29993543
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1109/TUFFC.2018.2842468
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