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Plane wave imaging improves single track location shear wave elasticity imaging
Single track location shear wave elasticity imaging (STL-SWEI) is immune to speckle bias, but the quality of the images is depth-dependent. We hypothesize that plane wave imaging can reduce the depth dependency of STL-SWEI. To test this hypothesis, we developed a novel technique known as plane-wave...
में बचाया:
| में प्रकाशित: | IEEE Trans Ultrason Ferroelectr Freq Control |
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| मुख्य लेखकों: | , , , , |
| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
2018
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| विषय: | |
| ऑनलाइन पहुंच: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6117195/ https://ncbi.nlm.nih.gov/pubmed/29993543 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1109/TUFFC.2018.2842468 |
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