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Toward Accurate Quantitative Elasticity Mapping of Rigid Nanomaterials by Atomic Force Microscopy: Effect of Acquisition Frequency, Loading Force, and Tip Geometry
Atomic force microscopy (AFM) has emerged as a popular tool for the mechanical mapping of soft nanomaterials due to its high spatial and force resolution. Its applications in rigid nanomaterials, however, have been underexplored. In this work, we studied elasticity mapping of common rigid materials...
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| 出版年: | Nanomaterials (Basel) |
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| 主要な著者: | , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
MDPI
2018
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6116254/ https://ncbi.nlm.nih.gov/pubmed/30110971 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano8080616 |
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