Schulz, F., Ritala, J., Krejčí, O., Seitsonen, A. P., Foster, A. S., & Liljeroth, P. (2018). Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy. ACS Nano.
Chicago Stili AlıntıSchulz, Fabian, Juha Ritala, Ondrej Krejčí, Ari Paavo Seitsonen, Adam S. Foster, ve Peter Liljeroth. "Elemental Identification By Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy." ACS Nano 2018.
MLA AlıntıSchulz, Fabian, et al. "Elemental Identification By Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy." ACS Nano 2018.
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