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Precise and economic FIB/SEM for CLEM: with 2 nm voxels through mitosis
A portfolio is presented documenting economic, high-resolution correlative focused ion beam scanning electron microscopy (FIB/SEM) in routine, comprising: (i) the use of custom-labeled slides and coverslips, (ii) embedding of cells in thin, or ultra-thin resin layers for correlative light and electr...
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| Publicado no: | Histochem Cell Biol |
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| Main Authors: | , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Springer Berlin Heidelberg
2018
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6096567/ https://ncbi.nlm.nih.gov/pubmed/29789992 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1007/s00418-018-1681-x |
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