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Tightly binding valence electron in aluminum observed through X-ray charge density study
Accurate and high reciprocal resolution experimental structure factors of aluminum were determined from a synchrotron powder X-ray diffraction data measured at 30 K with sin θ/λ < 2.31 Å(−1). The structure factors have small deviations from independent atom model in sin θ/λ < 0.83 Å(−1). Theor...
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| Publicado no: | Sci Rep |
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| Main Authors: | , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2018
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6086884/ https://ncbi.nlm.nih.gov/pubmed/30097629 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-30470-1 |
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