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Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics
The nanoscale optoelectronic properties of materials can be especially important for polycrystalline photovoltaics including many sensor and solar cell designs. For thin film solar cells such as CdTe, the open-circuit voltage and short-circuit current are especially critical performance indicators,...
Tallennettuna:
| Julkaisussa: | Beilstein J Nanotechnol |
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| Päätekijät: | , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
Beilstein-Institut
2018
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6009312/ https://ncbi.nlm.nih.gov/pubmed/29977713 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.9.171 |
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