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Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials
Many functional materials are difficult to analyse by scanning transmission electron microscopy (STEM) on account of their beam sensitivity and low contrast between different phases. The problem becomes even more severe when thick specimens need to be investigated, a situation that is common for mat...
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| Vydáno v: | R Soc Open Sci |
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| Hlavní autoři: | , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
The Royal Society Publishing
2018
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5990820/ https://ncbi.nlm.nih.gov/pubmed/29892376 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1098/rsos.171838 |
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