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Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials

Many functional materials are difficult to analyse by scanning transmission electron microscopy (STEM) on account of their beam sensitivity and low contrast between different phases. The problem becomes even more severe when thick specimens need to be investigated, a situation that is common for mat...

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Bibliografiska uppgifter
I publikationen:R Soc Open Sci
Huvudupphovsmän: Gnanasekaran, Karthikeyan, de With, Gijsbertus, Friedrich, Heiner
Materialtyp: Artigo
Språk:Inglês
Publicerad: The Royal Society Publishing 2018
Ämnen:
Länkar:https://ncbi.nlm.nih.gov/pmc/articles/PMC5990820/
https://ncbi.nlm.nih.gov/pubmed/29892376
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1098/rsos.171838
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