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A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction
The main focus of the presented work was the investigation of structure and residual stress gradients in the near-surface region of materials studied by X-ray diffraction. The multireflection method was used to measure depth-dependent stress variation in near-surface layers of a Ti sample (grade 2)...
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| Publicado no: | J Appl Crystallogr |
|---|---|
| Main Authors: | , , , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
International Union of Crystallography
2018
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5988007/ https://ncbi.nlm.nih.gov/pubmed/29896059 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576718004193 |
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