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Silver nanowires for highly reproducible cantilever based AFM-TERS microscopy: towards a universal TERS probe

Tip-enhanced Raman scattering (TERS) microscopy is a unique analytical tool to provide complementary chemical and topographic information of surfaces with nanometric resolution. However, difficulties in reliably producing the necessary metallized scanning probe tips has limited its widespread utilis...

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Vydáno v:Nanoscale
Hlavní autoři: Walke, Peter, Fujita, Yasuhiko, Peeters, Wannes, Toyouchi, Shuichi, Frederickx, Wout, De Feyter, Steven, Uji-i, Hiroshi
Médium: Artigo
Jazyk:Inglês
Vydáno: Royal Society of Chemistry 2018
Témata:
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC5985653/
https://ncbi.nlm.nih.gov/pubmed/29637970
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1039/c8nr02225a
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