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Assessing Item-Level Fit for the DINA Model

This research focuses on developing item-level fit checking procedures in the context of diagnostic classification models (DCMs), and more specifically for the “Deterministic Input; Noisy ‘And’ gate” (DINA) model. Although there is a growing body of literature discussing model fit checking methods f...

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Bibliografische gegevens
Gepubliceerd in:Appl Psychol Meas
Hoofdauteurs: Wang, Chun, Shu, Zhan, Shang, Zhuoran, Xu, Gongjun
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: SAGE Publications 2015
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Online toegang:https://ncbi.nlm.nih.gov/pmc/articles/PMC5978514/
https://ncbi.nlm.nih.gov/pubmed/29881024
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1177/0146621615583050
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