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Assessing Item-Level Fit for the DINA Model
This research focuses on developing item-level fit checking procedures in the context of diagnostic classification models (DCMs), and more specifically for the “Deterministic Input; Noisy ‘And’ gate” (DINA) model. Although there is a growing body of literature discussing model fit checking methods f...
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| 出版年: | Appl Psychol Meas |
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| 主要な著者: | , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
SAGE Publications
2015
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5978514/ https://ncbi.nlm.nih.gov/pubmed/29881024 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1177/0146621615583050 |
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