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Interfacial Strength and Surface Damage Characteristics of Atomically Thin h-BN, MoS2, and Graphene

Surface damage characteristics of single- and multilayer hexagonal boron nitride (h-BN), molybdenum disulfide (MoS(2)), and graphene films were systematically investigated via atomic force microscopy (AFM)-based progressive-force and constant-force scratch tests and Raman spectroscopy. The film-to-s...

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Bibliografiske detaljer
Udgivet i:ACS Appl Mater Interfaces
Main Authors: Khac, Bien-Cuong Tran, DelRio, Frank W., Chung, Koo-Hyun
Format: Artigo
Sprog:Inglês
Udgivet: 2018
Fag:
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC5969908/
https://ncbi.nlm.nih.gov/pubmed/29464947
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acsami.8b00001
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