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Study on the Effect of Oxygen Defects on the Electrical and Optical Properties of Thin Films
SnO(2) thin films grown directly on the Si substrate had larger average grain sizes as the power intensity increased, but the average grain size of the SnO(2) thin films grown in oxygen atmosphere decreased as the power intensity increased. Hall measurement of pure SnO(2) thin films showed that the...
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| Pubblicato in: | Scanning |
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| Autore principale: | |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
Hindawi
2018
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| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5941806/ https://ncbi.nlm.nih.gov/pubmed/29849859 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1155/2018/4592913 |
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