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Electrostatic force spectroscopy revealing the degree of reduction of individual graphene oxide sheets
Electrostatic force spectroscopy (EFS) is a method for monitoring the electrostatic force microscopy (EFM) phase with high resolution as a function of the electrical direct current bias applied either to the probe or sample. Based on the dielectric constant difference of graphene oxide (GO) sheets (...
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| Gepubliceerd in: | Beilstein J Nanotechnol |
|---|---|
| Hoofdauteurs: | , , , , , |
| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
Beilstein-Institut
2018
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| Onderwerpen: | |
| Online toegang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5905283/ https://ncbi.nlm.nih.gov/pubmed/29719765 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.9.106 |
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