Wird geladen...
Investigation of Surface Morphology of 6H-SiC Irradiated with He(+) and H(2)(+) Ions
Light ion implantation is one of the important procedures of smart cut for SiC-based semiconductor fabrication. This work investigated the surface morphologies and microstructures of single crystal 6H-SiC irradiated by one or both of H(2)(+) and He(+) ions at room temperature and then annealed at sp...
Gespeichert in:
| Veröffentlicht in: | Materials (Basel) |
|---|---|
| Hauptverfasser: | , , , , , |
| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
MDPI
2018
|
| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5848979/ https://ncbi.nlm.nih.gov/pubmed/29439460 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma11020282 |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|