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Growth and structural characterisation of Sr-doped Bi(2)Se(3) thin films
We grew Sr-doped Bi(2)Se(3) thin films using molecular beam epitaxy, and their high quality was verified using transmission electron microscopy. The thin films exhibited weak antilocalisation behaviours in magneto-resistance measurements, a typical transport signature of topological insulators, but...
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| Publicado no: | Sci Rep |
|---|---|
| Main Authors: | , , , , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2018
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5795016/ https://ncbi.nlm.nih.gov/pubmed/29391549 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-20615-7 |
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