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Interference experiment with asymmetric double slit by using 1.2-MV field emission transmission electron microscope
Advanced electron microscopy technologies have made it possible to perform precise double-slit interference experiments. We used a 1.2-MV field emission electron microscope providing coherent electron waves and a direct detection camera system enabling single-electron detections at a sub-second expo...
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| 出版年: | Sci Rep |
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| 主要な著者: | , , , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Nature Publishing Group UK
2018
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5772058/ https://ncbi.nlm.nih.gov/pubmed/29343790 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-19380-4 |
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