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Transition from silicene monolayer to thin Si films on Ag(111): comparison between experimental data and Monte Carlo simulation
Scanning tunneling microscopy (STM), Auger electron spectroscopy (AES) and low energy electron diffraction have been used to follow the growth of Si films on Ag(111) at various temperatures. Using a simple growth model, we have simulated the distribution of film thickness as a function of coverage d...
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| Publicado no: | Beilstein J Nanotechnol |
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| Main Authors: | , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Beilstein-Institut
2018
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5769081/ https://ncbi.nlm.nih.gov/pubmed/29379700 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.9.7 |
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