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Layer number identification of CVD-grown multilayer graphene using Si peak analysis
Since the successful exfoliation of graphene, various methodologies have been developed to identify the number of layers of exfoliated graphene. The optical contrast, Raman G-peak intensity, and 2D-peak line-shape are currently widely used as the first level of inspection for graphene samples. Altho...
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| Gepubliceerd in: | Sci Rep |
|---|---|
| Hoofdauteurs: | , , , , , , |
| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
Nature Publishing Group UK
2018
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| Onderwerpen: | |
| Online toegang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5766578/ https://ncbi.nlm.nih.gov/pubmed/29330376 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-017-19084-1 |
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