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Layer number identification of CVD-grown multilayer graphene using Si peak analysis

Since the successful exfoliation of graphene, various methodologies have been developed to identify the number of layers of exfoliated graphene. The optical contrast, Raman G-peak intensity, and 2D-peak line-shape are currently widely used as the first level of inspection for graphene samples. Altho...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:Sci Rep
Egile Nagusiak: No, You-Shin, Choi, Hong Kyw, Kim, Jin-Soo, Kim, Hakseong, Yu, Young-Jun, Choi, Choon-Gi, Choi, Jin Sik
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: Nature Publishing Group UK 2018
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC5766578/
https://ncbi.nlm.nih.gov/pubmed/29330376
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-017-19084-1
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