Cita APA

Ryu Cho, Y. K., Rawlings, C. D., Wolf, H., Spieser, M., Bisig, S., Reidt, S., . . . Knoll, A. W. (2017). Sub-10 Nanometer Feature Size in Silicon Using Thermal Scanning Probe Lithography. ACS Nano.

Citación estilo Chicago

Ryu Cho, Yu Kyoung, et al. "Sub-10 Nanometer Feature Size in Silicon Using Thermal Scanning Probe Lithography." ACS Nano 2017.

Cita MLA

Ryu Cho, Yu Kyoung, et al. "Sub-10 Nanometer Feature Size in Silicon Using Thermal Scanning Probe Lithography." ACS Nano 2017.