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1T1R Nonvolatile Memory with Al/TiO(2)/Au and Sol-Gel-Processed Insulator for Barium Zirconate Nickelate Gate in Pentacene Thin Film Transistor

A one-transistor and one-resistor (1T1R) architecture with a resistive random access memory (RRAM) cell connected to an organic thin-film transistor (OTFT) device is successfully demonstrated to avoid the cross-talk issues of only one RRAM cell. The OTFT device, which uses barium zirconate nickelate...

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Detalhes bibliográficos
Publicado no:Materials (Basel)
Main Authors: Lee, Ke-Jing, Chang, Yu-Chi, Lee, Cheng-Jung, Wang, Li-Wen, Wang, Yeong-Her
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI 2017
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5744343/
https://ncbi.nlm.nih.gov/pubmed/29232828
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma10121408
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