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Measurement of Nanowire Optical Modes Using Cross-Polarization Microscopy
A method to detect optical modes from vertical InGaAs nanowires (NWs) using cross-polarization microscopy is presented. Light scattered from the optical modes in the NWs is detected by filtering out the polarized direct reflection with a crossed polarizer. A spectral peak and a valley were seen to r...
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| Publicat a: | Sci Rep |
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| Autors principals: | , , , , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Nature Publishing Group UK
2017
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5736640/ https://ncbi.nlm.nih.gov/pubmed/29259279 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-017-18193-1 |
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