Carregant...

Proton dose distribution measurements using a MOSFET detector with a simple dose‐weighted correction method for LET effects

We experimentally evaluated the proton beam dose reproducibility, sensitivity, angular dependence and depth‐dose relationships for a new Metal Oxide Semiconductor Field Effect Transistor (MOSFET) detector. The detector was fabricated with a thinner oxide layer and was operated at high‐bias voltages....

Descripció completa

Guardat en:
Dades bibliogràfiques
Publicat a:J Appl Clin Med Phys
Autors principals: Kohno, Ryosuke, Hotta, Kenji, Matsuura, Taeko, Matsubara, Kana, Nishioka, Shie, Nishio, Teiji, Kawashima, Mitsuhiko, Ogino, Takashi
Format: Artigo
Idioma:Inglês
Publicat: John Wiley and Sons Inc. 2011
Matèries:
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC5718688/
https://ncbi.nlm.nih.gov/pubmed/21587191
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1120/jacmp.v12i2.3431
Etiquetes: Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!