Carregant...
Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials
In the past decades, in situ scanning electron microscopy (SEM) has become a powerful technique for the experimental study of low-dimensional (1D/2D) nanomaterials, since it can provide unprecedented details for individual nanostructures upon mechanical and electrical stimulus and thus uncover the f...
Guardat en:
| Publicat a: | Scanning |
|---|---|
| Autors principals: | , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Hindawi
2017
|
| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5676480/ https://ncbi.nlm.nih.gov/pubmed/29209445 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1155/2017/1985149 |
| Etiquetes: |
Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!
|