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Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials
In the past decades, in situ scanning electron microscopy (SEM) has become a powerful technique for the experimental study of low-dimensional (1D/2D) nanomaterials, since it can provide unprecedented details for individual nanostructures upon mechanical and electrical stimulus and thus uncover the f...
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| Publicado no: | Scanning |
|---|---|
| Main Authors: | , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Hindawi
2017
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5676480/ https://ncbi.nlm.nih.gov/pubmed/29209445 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1155/2017/1985149 |
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