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The influence of structural disorder and phonon on metal-to-insulator transition of VO(2)
We used temperature-dependent x-ray absorption fine structure (XAFS) measurements to examine the local structural properties around vanadium atoms at the V K edge from VO(2) films. A direct comparison of the simultaneously-measured resistance and XAFS regarding the VO(2) films showed that the therma...
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| Publicado en: | Sci Rep |
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| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
Nature Publishing Group UK
2017
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5666023/ https://ncbi.nlm.nih.gov/pubmed/29093503 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-017-14235-w |
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