Dual-comb spectroscopic ellipsometry

Spectroscopic ellipsometry is a means of investigating optical and dielectric material responses. Conventional spectroscopic ellipsometry is subject to trade-offs between spectral accuracy, resolution, and measurement time. Polarization modulation has afforded poor performance because of its sensiti...

ver descrição completa

Na minha lista:
Detalhes bibliográficos
Publicado no:Nat Commun
Main Authors: Minamikawa, Takeo, Hsieh, Yi-Da, Shibuya, Kyuki, Hase, Eiji, Kaneoka, Yoshiki, Okubo, Sho, Inaba, Hajime, Mizutani, Yasuhiro, Yamamoto, Hirotsugu, Iwata, Tetsuo, Yasui, Takeshi
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group UK 2017
Assuntos:
Article
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5606991/
https://ncbi.nlm.nih.gov/pubmed/28931818
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-017-00709-y
Tags: Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!

Registos relacionados