Dual-comb spectroscopic ellipsometry

Spectroscopic ellipsometry is a means of investigating optical and dielectric material responses. Conventional spectroscopic ellipsometry is subject to trade-offs between spectral accuracy, resolution, and measurement time. Polarization modulation has afforded poor performance because of its sensiti...

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Xehetasun bibliografikoak
Argitaratua izan da:Nat Commun
Egile Nagusiak: Minamikawa, Takeo, Hsieh, Yi-Da, Shibuya, Kyuki, Hase, Eiji, Kaneoka, Yoshiki, Okubo, Sho, Inaba, Hajime, Mizutani, Yasuhiro, Yamamoto, Hirotsugu, Iwata, Tetsuo, Yasui, Takeshi
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: Nature Publishing Group UK 2017
Gaiak:
Article
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC5606991/
https://ncbi.nlm.nih.gov/pubmed/28931818
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-017-00709-y
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