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Electron beam detection of a Nanotube Scanning Force Microscope
Atomic Force Microscopy (AFM) allows to probe matter at atomic scale by measuring the perturbation of a nanomechanical oscillator induced by near-field interaction forces. The quest to improve sensitivity and resolution of AFM forced the introduction of a new class of resonators with dimensions at t...
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| Publicado no: | Sci Rep |
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| Main Authors: | , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2017
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5599590/ https://ncbi.nlm.nih.gov/pubmed/28912433 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-017-11749-1 |
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