APA Citatie

Nminibapiel, D. M., Veksler, D., Kim, J., Shrestha, P. R., Campbell, J. P., Ryan, J. T., . . . Cheung, K. P. (2017). Impact of RRAM Read Fluctuations on the Program-Verify Approach. IEEE Electron Device Lett.

Chicago Style citaat

Nminibapiel, David M., Dmitry Veksler, J.-H Kim, Pragya R. Shrestha, Jason P. Campbell, Jason T. Ryan, Helmut Baumgart, en Kin. P. Cheung. "Impact of RRAM Read Fluctuations On the Program-Verify Approach." IEEE Electron Device Lett 2017.

MLA citatie

Nminibapiel, David M., et al. "Impact of RRAM Read Fluctuations On the Program-Verify Approach." IEEE Electron Device Lett 2017.