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Surface Sensitive Techniques for Advanced Characterization of Luminescent Materials
The important role of surface sensitive characterization techniques such as Auger electron spectroscopy (AES), X-ray photo electron spectroscopy (XPS), time of flight scanning ion mass spectrometry (TOF-SIMS) and High resolution transmission electron microscopy (HRTEM) for the characterization of di...
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| Udgivet i: | Materials (Basel) |
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| Hovedforfatter: | |
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
MDPI
2017
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5578272/ https://ncbi.nlm.nih.gov/pubmed/28777357 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma10080906 |
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