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Active control of bright electron beams with RF optics for femtosecond microscopy

A frontier challenge in implementing femtosecond electron microscopy is to gain precise optical control of intense beams to mitigate collective space charge effects for significantly improving the throughput. Here, we explore the flexible uses of an RF cavity as a longitudinal lens in a high-intensi...

Disgrifiad llawn

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Cyhoeddwyd yn:Struct Dyn
Prif Awduron: Williams, J., Zhou, F., Sun, T., Tao, Z., Chang, K., Makino, K., Berz, M., Duxbury, P. M., Ruan, C.-Y.
Fformat: Artigo
Iaith:Inglês
Cyhoeddwyd: American Crystallographic Association 2017
Pynciau:
Mynediad Ar-lein:https://ncbi.nlm.nih.gov/pmc/articles/PMC5565489/
https://ncbi.nlm.nih.gov/pubmed/28868325
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4999456
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