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Active control of bright electron beams with RF optics for femtosecond microscopy

A frontier challenge in implementing femtosecond electron microscopy is to gain precise optical control of intense beams to mitigate collective space charge effects for significantly improving the throughput. Here, we explore the flexible uses of an RF cavity as a longitudinal lens in a high-intensi...

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Publicat a:Struct Dyn
Autors principals: Williams, J., Zhou, F., Sun, T., Tao, Z., Chang, K., Makino, K., Berz, M., Duxbury, P. M., Ruan, C.-Y.
Format: Artigo
Idioma:Inglês
Publicat: American Crystallographic Association 2017
Matèries:
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC5565489/
https://ncbi.nlm.nih.gov/pubmed/28868325
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4999456
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