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Direct observation of multiple rotational stacking faults coexisting in freestanding bilayer MoS(2)
Electronic properties of two-dimensional (2D) MoS(2) semiconductors can be modulated by introducing specific defects. One important type of defect in 2D layered materials is known as rotational stacking fault (RSF), but the coexistence of multiple RSFs with different rotational angles was not direct...
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| Izdano u: | Sci Rep |
|---|---|
| Glavni autori: | , , , , , , , , , |
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
Nature Publishing Group UK
2017
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| Teme: | |
| Online pristup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5559605/ https://ncbi.nlm.nih.gov/pubmed/28814808 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-017-07615-9 |
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