Charge transport through DNA four-way junctions
Long range oxidative damage as a result of charge transport is shown to occur through single crossover junctions assembled from four semi-complementary strands of DNA. When a rhodium complex is tethered to one of the arms of the four-way junction assembly, thereby restricting its intercalation into...
保存先:
| 出版年: | Nucleic Acids Res |
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| 主要な著者: | , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Oxford University Press
2001
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.govhttps://pmc.ncbi.nlm.nih.gov/articles/PMC55456/ https://ncbi.nlm.nih.govhttps://pubmed.ncbi.nlm.nih.gov/11353071/ https://ncbi.nlm.nih.govhttps://doi.org/10.1093/nar/29.10.2026 |
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