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Electron ptychographic microscopy for three-dimensional imaging

Knowing the three-dimensional structural information of materials at the nanometer scale is essential to understanding complex material properties. Electron tomography retrieves three-dimensional structural information using a tilt series of two-dimensional images. In this paper, we report an altern...

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Detalles Bibliográficos
Publicado en:Nat Commun
Main Authors: Gao, Si, Wang, Peng, Zhang, Fucai, Martinez, Gerardo T., Nellist, Peter D., Pan, Xiaoqing, Kirkland, Angus I.
Formato: Artigo
Idioma:Inglês
Publicado: Nature Publishing Group UK 2017
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Acceso en liña:https://ncbi.nlm.nih.gov/pmc/articles/PMC5537274/
https://ncbi.nlm.nih.gov/pubmed/28761117
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-017-00150-1
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