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Thermoelectric La-doped SrTiO(3) epitaxial layers with single-crystal quality: from nano to micrometers
High-quality thermoelectric La(0.2)Sr(0.8)TiO(3) (LSTO) films, with thicknesses ranging from 20 nm to 0.7 μm, have been epitaxially grown on SrTiO(3)(001) substrates by enhanced solid-source oxide molecular-beam epitaxy. All films are atomically flat (with rms roughness < 0.2 nm), with low mosaic...
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| 出版年: | Sci Technol Adv Mater |
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| 主要な著者: | , , , , , , , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Taylor & Francis
2017
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5507149/ https://ncbi.nlm.nih.gov/pubmed/28740558 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1080/14686996.2017.1336055 |
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