APA Citatie

Hristu, R., Stanciu, S. G., Tranca, D. E., Polychroniadis, E. K., & Stanciu, G. A. (2017). Identification of stacking faults in silicon carbide by polarization-resolved second harmonic generation microscopy. Sci Rep.

Chicago Style citaat

Hristu, Radu, Stefan G. Stanciu, Denis E. Tranca, Efstathios K. Polychroniadis, en George A. Stanciu. "Identification of Stacking Faults in Silicon Carbide By Polarization-resolved Second Harmonic Generation Microscopy." Sci Rep 2017.

MLA citatie

Hristu, Radu, et al. "Identification of Stacking Faults in Silicon Carbide By Polarization-resolved Second Harmonic Generation Microscopy." Sci Rep 2017.