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Modeling the Error of the Medtronic Paradigm Veo Enlite Glucose Sensor

Continuous glucose monitors (CGMs) are prone to inaccuracy due to time lags, sensor drift, calibration errors, and measurement noise. The aim of this study is to derive the model of the error of the second generation Medtronic Paradigm Veo Enlite (ENL) sensor and compare it with the Dexcom SEVEN PLU...

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Detalles Bibliográficos
Publicado en:Sensors (Basel)
Main Authors: Biagi, Lyvia, Ramkissoon, Charrise M., Facchinetti, Andrea, Leal, Yenny, Vehi, Josep
Formato: Artigo
Idioma:Inglês
Publicado: MDPI 2017
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Acceso en liña:https://ncbi.nlm.nih.gov/pmc/articles/PMC5492301/
https://ncbi.nlm.nih.gov/pubmed/28604634
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s17061361
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