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The Effect of Leaf Stacking on Leaf Reflectance and Vegetation Indices Measured by Contact Probe during the Season
The aims of the study were: (i) to compare leaf reflectance in visible (VIS) (400–700 nm), near-infrared (NIR) (740–1140 nm) and short-wave infrared (SWIR) (2000–2400 nm) spectral ranges measured monthly by a contact probe on a single leaf and a stack of five leaves (measurement setup (MS)) of two b...
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| Publié dans: | Sensors (Basel) |
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| Auteurs principaux: | , , |
| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
MDPI
2017
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| Sujets: | |
| Accès en ligne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5492110/ https://ncbi.nlm.nih.gov/pubmed/28538685 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s17061202 |
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