Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

The full strain and stress tensor determination in a triaxially stressed single crystal using X-ray diffraction requires a series of lattice spacing measurements at different crystal orientations. This can be achieved using a tunable X-ray source. This article reports on a novel experimental procedu...

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Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:J Appl Crystallogr
Egile Nagusiak: Abboud, A., Kirchlechner, C., Keckes, J., Conka Nurdan, T., Send, S., Micha, J. S., Ulrich, O., Hartmann, R., Strüder, L., Pietsch, U.
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: International Union of Crystallography 2017
Gaiak:
Research Papers
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC5458596/
https://ncbi.nlm.nih.gov/pubmed/28656042
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576717005581
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