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Improving the Resolution of Kendrick Mass Defect Analysis for Polymer Ions with Fractional Base Units
The concept of a fractional base unit for the Kendrick mass defect (KMD) analysis of polymer ions is introduced for the first time. A fraction of the ethylene oxide (EO) repeat unit (namely EO/8) has been used for the KMD analysis of a poly(ethylene oxide) and found to amplify the variations of KMD...
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| Vydáno v: | Mass Spectrom (Tokyo) |
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| Hlavní autoři: | , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
The Mass Spectrometry Society of Japan
2017
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5447562/ https://ncbi.nlm.nih.gov/pubmed/28580221 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.5702/massspectrometry.A0055 |
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