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Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals
We measure the laser-induced damage threshold (LIDT) fluence under single shot at the surface of Sapphire samples prepared following the standards of two methods yielding to different surface finish and used in optical and laser industry. We use AFM microscopy to measure the roughness parameter Ra a...
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| Publicado no: | Sci Rep |
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| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2017
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5430787/ https://ncbi.nlm.nih.gov/pubmed/28455507 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-017-01192-7 |
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